Measurement Systems

I nostri sistemi

Una gamma completa di sistemi per affrontare ogni applicazione. Dalla misura di piccoli componenti alla verifica di grandi strutture, ogni tecnologia viene selezionata in funzione del componente e dell’obiettivo finale.

Tecnologia moderna

Sistemi per ogni scala di misura

From components just a few centimeters in size to large aerospace structures:
—each system covers a specific range of applications with the highest accuracy in its category.

AR Inspection

ATOS Compact Scan

Capture accurate data quickly with an optical scanner designed to ensure metrological precision, operational flexibility, and reliable results.

AR Inspection

Atos Q

ATOS Q is a 3D optical scanner designed to ensure high precision and maximum flexibility in measurement and inspection tasks.

AR Inspection

Leica RTC360

The Leica RTC360 is a high-performance 3D laser scanner designed to quickly capture environments, structures, and components, converting them into high-density 3D point clouds.

AR Inspection

SuPAR

SuPAR™ offers a practical solution for the digitization of production processes, integrating CAD data, augmented reality, and visual inspection into a single operating environment.

AR Inspection

Tritop

TRITOP is the ZEISS system for photogrammetric measurement of three-dimensional coordinates, designed to inspect large components directly in their working environment.

AR Inspection

Zeiss Contura

ZEISS CONTURA is a coordinate measuring machine designed to handle a wide variety of dimensional inspection tasks, combining metrological accuracy, speed, and configuration flexibility.

AR Inspection

ZEISS O-DETECT

O-DETECT is an optical measuring machine designed to precisely inspect small and delicate components, even when contact measurement is not the most suitable solution.

AR Inspection

ZEISS Stemi 355

The Stemi 355 is a compact stereomicroscope designed to observe, analyze, and document three-dimensional details with high clarity. Thanks to its 3D stereoscopic view, 5:1 zoom, and various illumination modes, it allows users to examine surfaces, components, and details that are difficult to assess with the naked eye.